National Instruments PXIe-4145 Product Overview

The National Instruments PXIe-4145 is a four-channel precision Source Measure Unit (SMU) designed for PXI Express automated test and measurement systems. As a member of the NI PXI Source Measure Unit family, the National Instruments PXIe-4145 combines programmable voltage/current sourcing with precision measurement capability in a single modular instrument. It is designed to provide accurate I-V characterization, device power testing, and dynamic electrical measurements for semiconductor components, electronic assemblies, and research devices. The module supports four-quadrant operation, allowing each channel to source or sink current while measuring voltage and current characteristics of the device under test (DUT).

The National Instruments PXIe-4145 integrates into PXI Express chassis platforms and provides four independent SMU channels with ±6 V voltage capability and up to ±500 mA current output. Each channel includes remote four-wire sensing to improve measurement accuracy by compensating for voltage drops caused by cable resistance. The module is designed for synchronization with other PXI instruments through hardware timing resources, making it suitable for high-volume automated test systems where multiple devices require coordinated power sourcing and measurement.

In practical test engineering environments, the National Instruments PXIe-4145 provides a compact solution for applications requiring precise electrical characterization and fast test execution. Its programmable sequencing functions, SourceAdapt technology, and PXI Express integration allow engineers to optimize measurement speed while maintaining stable device interaction. The module is commonly deployed in semiconductor validation, production test systems, battery research, electronic component evaluation, and laboratory automation platforms where repeatable electrical measurements are required.

Technical Specifications

Main Features and Advantages

Precision source and measurement capability

The National Instruments PXIe-4145 combines programmable voltage/current output and measurement functions, eliminating the need for separate power sources and measurement instruments in many automated test applications. Each channel can independently control and monitor electrical parameters, making it suitable for detailed device characterization and production verification.

Four-channel parallel testing design

With four independent SMU channels, the module supports multi-pin and multi-device test configurations. This channel density is useful in semiconductor testing, component validation, and automated production environments where reducing test cycle time is a major consideration. Multiple channels can be synchronized through PXI hardware timing for coordinated measurement sequences.

PXle-4145

SourceAdapt technology for load optimization

The National Instruments PXIe-4145 incorporates SourceAdapt technology, allowing engineers to adjust transient response characteristics according to the connected load. This helps balance measurement speed and signal stability when testing devices with different electrical behaviors, including capacitive, resistive, and semiconductor loads.

Accurate remote sensing design

Integrated four-wire remote sensing improves voltage measurement accuracy by compensating for losses in test cables and connections. This feature is especially valuable in low-voltage applications where small measurement errors can affect device evaluation results.

PXI Express system integration

The module is designed for PXIe chassis architectures and works with NI software environments such as LabVIEW and TestStand. Engineers can integrate the National Instruments PXIe-4145 with switching modules, digital test equipment, waveform instruments, and other PXI hardware to build complete automated measurement systems.

Maintenance and deployment considerations

For replacement or system expansion projects, engineers should verify PXIe chassis compatibility, driver versions, calibration status, test software configuration, and external cabling requirements. Precision measurement modules depend on correct calibration and system configuration to maintain expected performance.

Application Fields

The National Instruments PXIe-4145 is widely used in semiconductor and electronic test environments where precise current and voltage sourcing is required. In semiconductor manufacturing, it supports device characterization, wafer-level testing, IC validation, and parametric measurement tasks by providing controlled electrical stimulation and accurate response measurement.

In automotive electronics development, the module can be integrated into automated test platforms for evaluating electronic control units, sensors, power management devices, and battery-related components. Its synchronized multi-channel operation supports testing scenarios where several electrical points must be monitored simultaneously.

In aerospace and defense electronics testing, the National Instruments PXIe-4145 assists engineers in validating high-reliability electronic assemblies, embedded devices, and specialized components. The ability to generate controlled electrical conditions and capture device responses makes it suitable for laboratory qualification and production verification.

In power electronics research, the module is applied to characterize converters, semiconductor switching devices, power management circuits, and energy storage components. Its four-quadrant operation allows engineers to evaluate devices under different operating conditions.

The module is also used in research laboratories, universities, and industrial development centers for materials research, sensor testing, and electronic component analysis. When combined with PXI Express controllers and measurement software, the National Instruments PXIe-4145 provides a flexible platform for automated electrical testing and data collection.

Related Products

• NI PXIe-4140 – Four-channel precision SMU with lower current capability, suitable for general-purpose voltage and current measurement applications.
• NI PXIe-4141 – Four-channel SMU designed for applications requiring enhanced measurement sensitivity and programmable output characteristics.
• NI PXIe-4143 – Higher voltage SMU variant supporting applications requiring increased voltage sourcing capability.
• NI PXIe-4144 – Similar four-channel SMU model with ±6 V and ±500 mA capability for precision electronic testing.
• NI PXIe-4147 – Higher current SMU module designed for applications requiring up to 3 A output capability.
• NI PXIe-4162 – Multi-channel SMU platform designed for high-density semiconductor and automated test applications.
• NI PXIe-1082 – PXI Express chassis used for installing PXIe measurement modules.
• NI PXIe-8880 – Embedded PXI Express controller used for high-performance automated test system configurations.